Modern Radar/ EW System Level Testing based on NI platform

Modern Radar/ EW System Level Testing based on NI platform

Join us and learn about: Key challenges in designing test solutions for military applications and What you need to do in terms of simulation capability if you want to create a test scenario realistic enough for validating your capability in the military domain....
NI Semiconductor Exchange

NI Semiconductor Exchange

Join us for our inaugural Semiconductor Exchange on October 29, NI’s largest virtual event connecting engineers, business leaders, and partners in the semiconductor industry. Hear bold perspectives and exchange ideas and insights to navigate critical industry...
Hardware-In-The-Loop: Test Early and Often to Maximize Innovation

Hardware-In-The-Loop: Test Early and Often to Maximize Innovation

Learn how Hardware-In-The-Loop (HIL) testing can benefit your organization both as a testing methodology that gives you the utmost confidence in releasing a market ready product and as a tool that maximizes innovation by allowing designers to iterate quickly on ideas....