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Electronic Design & Semiconductor

Electronics Functional Test

Test engineers must build performance- and cost-optimized systems while developing quickly to meet demanding new product introduction (NPI) schedules. When building or buying a test system, remember that the best solutions scale to meet escalating requirements, simplify development, and improve sustainability.

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High-Volume Production Test

Production test leaders need a smarter alternative to traditional automated test equipment (ATE) to meet cost and coverage requirements of increasingly complex RF and mixed-signal ICs.

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3D-IC Design

Comprehensive solution spanning integration, packaging, custom and digital implementation, verification, system analysis, and interconnect IP for chiplet-based designs.

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AWR software helps design engineers to dramatically reduce development time and cost for components, circuits, systems and subsystems employed in wireless, high-speed wired, broadband, aerospace and defense, and electro-optical applications.

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