Semiconductor

Semiconductor technology requirements often outpace the test coverage that traditional approaches offer for analog, mixed-signal, and RF test. Semiconductor test engineers need smarter solutions that address cost, scalability, design, and device challenges.

 

Flexible Semiconductor Test Solutions

As the devices we use get smarter, they become more software centric, and the semiconductor industry that is powering these smart devices is going through a transformation not only in how the ICs are designed and manufactured but also in how they are tested. Regardless of the type of smart device, the business drivers are the same.

IC makers must deliver more integrated functionality, ensure the highest reliability for mission-critical applications, remain highly cost competitive, and ensure a short time to market to meet tight design windows. NI delivers smarter test solutions that scale from the lab to the production floor and meet the business needs of IC manufacturers.

 

High-Volume Production Test

Production test leaders need a smarter alternative to traditional ATE to meet cost and coverage requirements of increasingly complex RF and mixed-signal ICs.

Lab Characterization and Validation

Industry leaders are using a new approach to semiconductor test to meet the latest RF and mixed-signal IC test challenges. With NI’s open, software-defined platform, customers can meet evolving test requirements and manage schedule pressures.

Wafer-Level Parametric Test

Wafer-level test engineers need to reduce test time without sacrificing measurement quality and accuracy.

Test Smarter with NI PXI Source Measure Units

National Instruments offers a wide range of source measure units (SMUs) for automated test and lab characterization applications. These SMUs combine the power and measurement performance of traditional box SMUs with NI technology that makes them smaller, faster, and more flexible.

Additional Resources

Check the National Instruments semiconductor solutions page to access even more resources.